Lu Zhaolin, Murakowski Janusz A, Schuetz Christopher A, Shi Shouyuan, Schneider Garrett J, Prather Dennis W
Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, USA.
Phys Rev Lett. 2005 Oct 7;95(15):153901. doi: 10.1103/PhysRevLett.95.153901. Epub 2005 Oct 4.
We experimentally demonstrate subwavelength resolution imaging at microwave frequencies by a three-dimensional (3D) photonic-crystal flat lens using full 3D negative refraction. The photonic crystal was fabricated in a layer-by-layer process. A subwavelength pinhole source and a dipole detector were employed for the measurement. By point-by-point scanning, we obtained the image of the pinhole source shown in both amplitude and phase, which demonstrated the imaging mechanism and subwavelength feature size in all three dimensions. An image of two pinhole sources with subwavelength spacing showed two resolved spots, which further verified subwavelength resolution.
我们通过使用全三维负折射的三维(3D)光子晶体平板透镜,在微波频率下通过实验证明了亚波长分辨率成像。光子晶体是通过逐层工艺制造的。使用亚波长针孔源和偶极探测器进行测量。通过逐点扫描,我们获得了针孔源在幅度和相位上的图像,这展示了成像机制以及在所有三个维度上的亚波长特征尺寸。具有亚波长间距的两个针孔源的图像显示出两个分辨的光斑,这进一步验证了亚波长分辨率。