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酸功能化表面与碱功能化表面之间的相互作用。

Interactions between acid- and base-functionalized surfaces.

作者信息

Giesbers Marcel, Kleijn J Mieke, Cohen Stuart Martien A

机构信息

Laboratory of Physical Chemistry and Colloid Science, Wageningen University, P.O. Box 8038, Wageningen, 6700 EK, The Netherlands.

出版信息

J Colloid Interface Sci. 2002 Aug 1;252(1):138-48. doi: 10.1006/jcis.2002.8388.

Abstract

In this paper we present an AFM force study on interactions between chemically modified surfaces. Surfaces with terminal groups of either NH(2) or COOH were obtained by chemisorption of a silane-based compound (3-amino-propyltriethoxysilane) on silica or a thiol compound (11-mercapto undecanoic acid) on gold. The surfaces were characterized by streaming potential and contact angle measurements. For the NH(2) surfaces the density of functional groups strongly depends on the pretreatment of the silica. Both the NH(2) and COOH surfaces show a steady and ongoing loss of functional groups, but on the time scale of our force measurements they can be considered to be stable. Interaction curves for the various combinations of surfaces in aqueous solutions show a strong correlation with the ionization state of the surface groups. The approach curves can be explained on the basis of electrostatic interactions. On retraction a pH-dependent adhesion is found, the strongest being between NH(2) and COOH surfaces as a result of acid-base interactions. Between NH(2) layers and between COOH layers there is also adhesion, due to the formation of H bonds. The corresponding work of adhesion W was calculated using the DMT (Derjaguin, Muller, Toporov) equation. The values of W obtained are small compared to literature data and suggest that only a fraction of the functional groups in the contact area is involved in acid-base or H-bond interactions. This is attributed mainly to the roughness of the surfaces, which substantially reduces adhesion. A rough estimate is made for the rupture force of the NH(2)-COOH acid-base bond in water.

摘要

在本文中,我们展示了一项关于化学修饰表面之间相互作用的原子力显微镜力研究。通过在二氧化硅上化学吸附基于硅烷的化合物(3-氨基丙基三乙氧基硅烷)或在金上化学吸附硫醇化合物(11-巯基十一烷酸),获得了具有NH₂或COOH端基的表面。通过流动电势和接触角测量对这些表面进行了表征。对于NH₂表面,官能团的密度强烈依赖于二氧化硅的预处理。NH₂和COOH表面都显示出官能团的稳定且持续损失,但在我们的力测量时间尺度上,它们可被视为稳定的。水溶液中各种表面组合的相互作用曲线与表面基团的电离状态显示出强烈的相关性。接近曲线可以基于静电相互作用来解释。在回缩时,发现了pH依赖性粘附,由于酸碱相互作用,最强的粘附发生在NH₂和COOH表面之间。在NH₂层之间以及COOH层之间也存在粘附,这是由于氢键的形成。使用DMT(Derjaguin、Muller、Toporov)方程计算了相应的粘附功W。与文献数据相比,获得的W值较小,这表明接触区域中只有一部分官能团参与酸碱或氢键相互作用。这主要归因于表面的粗糙度,它大大降低了粘附力。对水中NH₂-COOH酸碱键的断裂力进行了粗略估计。

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