Zhao Chunyu, Kang Dongyel, Burge James H
College of Optical Sciences, the University of Arizona, 1630 East University Boulevard, Tucson, Arizona 85721, USA.
Appl Opt. 2005 Dec 10;44(35):7548-53. doi: 10.1364/ao.44.007548.
Interferometers that use different states of polarization for the reference and the test beams can modulate the relative phase shift by using polarization optics in the imaging system. Thus the interferometer can capture simultaneous images that have a fixed phase shift, which can be used for phase-shifting interferometry. As all measurements are made simultaneously, the interferometer is not sensitive to vibration. Fizeau interferometers of this type have an advantage compared with Twyman-Green-type systems because they are common-path interferometers. However, a polarization Fizeau interferometer is not strictly common path when both wavefronts are transmitted by an optic that suffers from birefringence. The two polarized beams see different phases owing to birefringence; as a result, an error can be introduced in the measurement. We study the effect of birefringence on measurement accuracy when different polarization techniques are used in Fizeau interferometers. We demonstrate that measurement error is reduced dramatically and can be eliminated if the reference and test beams are circularly polarized rather than linearly polarized.
对于参考光束和测试光束使用不同偏振态的干涉仪,可以通过在成像系统中使用偏振光学元件来调制相对相移。因此,该干涉仪可以捕获具有固定相移的同步图像,可用于相移干涉测量。由于所有测量都是同时进行的,所以该干涉仪对振动不敏感。与泰曼-格林型系统相比,这种类型的斐索干涉仪具有优势,因为它们是共光路干涉仪。然而,当两个波前都通过存在双折射的光学元件传输时,偏振斐索干涉仪并非严格的共光路。由于双折射,两束偏振光会看到不同的相位;结果,测量中可能会引入误差。我们研究了在斐索干涉仪中使用不同偏振技术时双折射对测量精度的影响。我们证明,如果参考光束和测试光束是圆偏振而非线偏振,测量误差会大幅降低并可消除。