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微衰减全反射红外光谱在光纤涂层定量分析中的应用:光学接触的影响

Application of micro-attenuated total reflectance infrared spectroscopy to quantitative analysis of optical fiber coatings: effects of optical contact.

作者信息

Stolov Andrei A, Simoff Debra A

机构信息

OFS, Specialty Photonics Division, 55 Darling Drive, Avon, Connecticut 06001, USA.

出版信息

Appl Spectrosc. 2006 Jan;60(1):29-38. doi: 10.1366/000370206775382820.

Abstract

Micro-attenuated total reflectance (ATR) infrared spectroscopy is one of the few methods applicable for an in situ analysis of polymer coatings. In this method, the information is collected using an internal reflection element (IRE), which is brought into contact with the coated substrate. Perfect optical contact is hardly achievable for non-flat substrates and/or for those samples that cannot be well aligned with respect to the IRE. Consequently, the infrared peak intensities, their ratios, and all quantities calculated from the spectra become dependent upon the optical contact quality. In this work, we suggest a model that describes the peak intensities in terms of the optical contact. As an illustration, we apply this model to polymer-coated optical fibers. Relatively small diameters of tested fibers and their cylindrical shape result in imperfect optical contact between the sample and the IRE. Spectroscopic approaches of determining the degree of cure of polymer coatings are analyzed in view of the obtained results. Ways of minimizing the error induced by imperfect optical contact are suggested.

摘要

微衰减全反射(ATR)红外光谱法是少数适用于聚合物涂层原位分析的方法之一。在该方法中,信息是通过与涂覆基板接触的内反射元件(IRE)收集的。对于非平面基板和/或那些无法与IRE良好对准的样品,很难实现完美的光学接触。因此,红外峰强度、它们的比率以及从光谱计算出的所有量都取决于光学接触质量。在这项工作中,我们提出了一个根据光学接触来描述峰强度的模型。作为示例,我们将此模型应用于聚合物涂覆的光纤。测试光纤的相对较小直径及其圆柱形形状导致样品与IRE之间的光学接触不完美。根据所得结果分析了确定聚合物涂层固化程度的光谱方法。提出了将不完美光学接触引起的误差降至最低的方法。

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