Genzer Jan, Efimenko Kirill, Fischer Daniel A
Department of Chemical and Biomolecular Engineering, North Carolina State University, Raleigh, North Carolina 27695-7905, USA. Jan_Genzer@ ncsu.edu
Langmuir. 2006 Sep 26;22(20):8532-41. doi: 10.1021/la061016r.
The goal of this study is to elucidate the formation of molecular gradients made of semifluorinated organosilanes (SFOs) on flat substrates by using a methodology developed by Chaudhury and Whitesides (Science 1992, 256, 1539). We use surface-sensitive combinatorial near-edge X-ray absorption fine structure (combi-NEXAFS) spectroscopy to measure the position-dependent concentration and orientation of SFO molecules in SFO molecular gradients on flat silica surfaces. Using the combi-NEXAFS data, we establish the correlation between the fraction of the F(CF(2))(8)(CH(2))(2)- species on the substrate and the average tilt angle of the -(CF(2))(8)F group in the SFO as a function of the deposition gas medium (air vs nitrogen) and the end group around the silicon atom (monofunctional vs trifunctional). In addition, we utilize the gradient geometry to comprehend the mechanism of formation of SFO self-assembled monolayers (SAMs). Specifically, we provide evidence that depending on the nature of the end group in the SFO and the vapor phase the SFO molecules add themselves into the existing SAMs either as individual molecules or as multimolecular complexes.
本研究的目标是通过使用乔杜里和怀特塞兹开发的一种方法(《科学》,1992年,第256卷,第1539页),阐明在平坦基底上由半氟化有机硅烷(SFO)形成的分子梯度。我们使用表面敏感的组合近边X射线吸收精细结构(combi-NEXAFS)光谱来测量平坦二氧化硅表面上SFO分子梯度中SFO分子的位置依赖性浓度和取向。利用combi-NEXAFS数据,我们确定了基底上F(CF(2))(8)(CH(2))(2)-物种的比例与SFO中-(CF(2))(8)F基团的平均倾斜角之间的相关性,该相关性是沉积气体介质(空气与氮气)以及硅原子周围端基(单官能与三官能)的函数。此外,我们利用梯度几何结构来理解SFO自组装单分子层(SAMs)的形成机制。具体而言,我们提供的证据表明,根据SFO中端基的性质和气相情况,SFO分子以单个分子或多分子复合物的形式添加到现有的SAMs中。