Suppr超能文献

掺杂在团簇中的硅和锗原子的电子性质:In(n)Si(m)和In(n)Ge(m)

Electronic properties of Si and Ge atoms doped in clusters: In(n)Si(m) and In(n)Ge(m).

作者信息

Akutsu Minoru, Koyasu Kiichirou, Atobe Junko, Miyajima Ken, Mitsui Masaaki, Nakajima Atsushi

机构信息

Department of Chemistry, Faculty of Science and Technology, Keio University, 3-14-1, Hiyoshi, Yokohama 223-8522, Japan.

出版信息

J Phys Chem A. 2007 Feb 1;111(4):573-7. doi: 10.1021/jp065921w.

Abstract

Electronic properties of silicon and germanium atom doped indium clusters, In(n)Si(m) and In(n)Ge(m), were investigated by photoionization spectroscopy of the neutrals and photoelectron spectroscopy of the anions. Size dependence of ionization energy and electron affinity for In(n)Si(1) and In(n)Ge(1) exhibit pronounced even-odd alternation at cluster sizes of n = 10-16, as compared to those for pure In(n) clusters. This result shows that symmetry lowering with the doped atom of Si or Ge results in undegeneration of electronic states in the 1d shell formed by monovalent In atoms.

摘要

通过中性原子的光电离光谱和阴离子的光电子能谱研究了硅和锗原子掺杂的铟团簇In(n)Si(m)和In(n)Ge(m)的电子性质。与纯In(n)团簇相比,In(n)Si(1)和In(n)Ge(1)的电离能和电子亲和能的尺寸依赖性在n = 10 - 16的团簇尺寸下呈现出明显的奇偶交替。该结果表明,硅或锗掺杂原子导致的对称性降低使得由单价铟原子形成的1d壳层中的电子态简并消除。

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验