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Fabrication of a novel micron scale Y-structure-based chiral metamaterial: Simulation and experimental analysis of its chiral and negative index properties in the terahertz and microwave regimes.

作者信息

Wongkasem Nantakan, Akyurtlu Alkim, Marx Kenneth A, Goodhue William D, Li Jin, Dong Qi, Ada Earl T

机构信息

Department of Electrical and Computer Engineering, University of Massachusetts Lowell, Lowell, Massachusetts 01854, USA.

出版信息

Microsc Res Tech. 2007 Jun;70(6):497-505. doi: 10.1002/jemt.20473.

Abstract

In this report, we describe the fabrication of a chiral metamaterial based on a periodic array of Y-shaped Al structures on a dielectric Mylar substrate. The unit cell dimensions of the Y-structure are approximately 100 microm on a side with 8 microm linewidths. The fabricated Y-structure elements are characterized using scanning electron microscopy (SEM) and atomic force microscopy (AFM). Quantitative elemental analyses were carried out on both the Y-structure, comprised of Al and its oxide, as well as adjacent regions of the underlying mylar substrate using the energy dispersive X-ray spectroscopy (EDS) capability of the SEM. Finite-Difference Time-Domain (FDTD) calculations of the negative index of refraction for a 3D wedge of multiple layers of the 2D metamaterials showed that these metamaterials possess double negative (-mu,-epsilon) electromagnetic bulk properties at THz frequencies. The same negative index of refraction was determined for a wedge comprised of appropriately scaled larger Y-structures simulated in the microwave region. This double negative property was confirmed experimentally by microwave measurements on a 3D wedge comprised of stacked and registered Y-structure sheets.

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