Kildishev Alexander V, Drachev Vladimir P, Chettiar Uday K, Shalaev Vladimir M, Werner Douglas H, Kwon Do-Hoon
Birk Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA.
Opt Lett. 2007 Jun 1;32(11):1510-1. doi: 10.1364/ol.32.001510.
We dispute Grigorenko's statement [Opt. Lett. 31, 2483 (2006)] that measuring only the reflection intensity spectrum is sufficient for determining the effective refractive index. In addition, our simulations do not confirm his conclusions regarding the negative refractive index and the negative permeability of the nanopillar sample in the visible range.