Sim K S, Law K K, Tso C P
Faculty of Engineering and Technology, Multimedia University, Melaka, Malaysia.
Microsc Res Tech. 2007 Nov;70(11):919-27. doi: 10.1002/jemt.20490.
A new filter is developed for the enhancement of scanning electron microscope (SEM) images. A mixed Lagrange time delay estimation auto-regression (MLTDEAR)-based interpolator is used to provide an estimate of noise variance to a standard Wiener filter. A variety of images are captured and the performance of the filter is shown to surpass the conventional noise filters. As all the information required for processing is extracted from a single image, this method is not constrained by image registration requirements and thus can be applied in real-time in cases where specimen drift is presented in the SEM image.