Mao Q, Schleidt S, Zimmermann H, Jeschke G
Max Planck Institute for Polymer Research, Postfach 3148, 55021, Mainz, Germany.
Phys Chem Chem Phys. 2008 Feb 28;10(8):1156-67. doi: 10.1039/b713788e. Epub 2007 Dec 13.
Double electron electron resonance (DEER), deuterium electron spin-echo envelope modulation (ESEEM) spectroscopy and 31P electron nuclear double resonance (ENDOR) spectroscopy were applied to site-specifically spin-labeled surfactants in the organically modified layered silicate magadiite and its composites with polystyrene (PS) and polycaprolactone (PCL). The organomagadiite consist of stacks of silicate platelets with surfactant layers between these platelets. In PS composites the stacks are dispersed in the polymer matrix as a whole, while melt processing with PCL leads to intercalation of polymer chains into the galleries between the platelets. The DEER data prove that even in the case of the non-intercalated PS composites the density of surfactant molecules changes drastically during composite formation on length scales of a few nanometers. Deuterium ESEEM data demonstrate that spin labels attached both in the middle and at the end of the alkyl chain have contact with the headgroups of neighboring surfactant molecules. By analysis of the 31P ENDOR spectra, two characteristic distances are found between the spin labels and the headgroups of phosphonium surfactants. The shorter, proximal distance can be assigned to headgroups in the same surfactant layer. By comparison with the basal spacing between consecutive silicate platelets the longer, distal distance is assigned to a layer of surfactants that is not attached to the surface of the next platelet but rather located between platelets. Altogether the data support a picture of trilayers of disordered surfactant molecules with their alkyl chains oriented nearly parallel to the surface.
双电子电子共振(DEER)、氘电子自旋回波包络调制(ESEEM)光谱和31P电子核双共振(ENDOR)光谱被应用于有机改性层状硅酸盐辉沸石及其与聚苯乙烯(PS)和聚己内酯(PCL)的复合材料中位点特异性自旋标记的表面活性剂。有机辉沸石由硅酸盐片层堆叠而成,片层之间存在表面活性剂层。在PS复合材料中,这些堆叠整体分散在聚合物基体中,而与PCL的熔融加工导致聚合物链插入片层之间的通道中。DEER数据证明,即使在未插层的PS复合材料中,表面活性剂分子的密度在复合材料形成过程中在几纳米的长度尺度上也会发生剧烈变化。氘ESEEM数据表明,连接在烷基链中间和末端的自旋标记与相邻表面活性剂分子的头基有接触。通过对31P ENDOR光谱的分析,发现自旋标记与鏻表面活性剂头基之间有两个特征距离。较短的近端距离可归因于同一表面活性剂层中的头基。通过与连续硅酸盐片层之间的基面间距进行比较,较长的远端距离归因于一层未附着在下一个片层表面而是位于片层之间的表面活性剂。总之,这些数据支持了无序表面活性剂分子形成三层结构的图像,其烷基链几乎平行于表面取向。