Torcal-Milla Francisco Jose, Sanchez-Brea Luis Miguel, Bernabeu Eusebio
Optics Department, Universidad Complutense de Madrid, Facultad de Ciencias Físicas, Ciudad Universitaria s.n., 28040, Madrid, Spain.
Opt Express. 2008 Nov 24;16(24):19757-69. doi: 10.1364/oe.16.019757.
We analyze the far field and near field diffraction pattern produced by an amplitude grating whose strips present rough edges. Due to the stochastic nature of the edges a statistical approach is performed. The grating with rough edges is not purely periodic, although it still divides the incident beam in diffracted orders. The intensity of each diffraction order is modified by the statistical properties of the irregular edges and it strongly decreases when roughness increases except for the zero-th diffraction order. This decreasing firstly affects to the higher orders. Then, it is possible to obtain an amplitude binary grating with only diffraction orders -1, 0 and +1. On the other hand, numerical simulations based on Rayleigh-Sommerfeld approach have been used for the case of near field. They show that the edges of the self-images are smoother than the edges of the grating. Finally, we fabricate gratings with rough edges and an experimental verification of the results is performed.
我们分析了由具有粗糙边缘条纹的振幅光栅产生的远场和近场衍射图案。由于边缘的随机性,采用了统计方法。具有粗糙边缘的光栅并非纯粹周期性的,尽管它仍将入射光束分成不同的衍射级次。每个衍射级次的强度会因不规则边缘的统计特性而改变,除零级衍射外,粗糙度增加时强度会大幅降低。这种降低首先影响高阶衍射级次。然后,有可能获得仅具有 -1、0 和 +1 衍射级次的振幅二元光栅。另一方面,基于瑞利 - 索末菲方法的数值模拟已用于近场情况。结果表明,自成像的边缘比光栅的边缘更平滑。最后,我们制作了具有粗糙边缘的光栅,并对结果进行了实验验证。