Plumeré Nicolas, Speiser Bernd, Mayer Hermann A, Joosten Dominik, Wesemann Lars
Institut für Organische Chemie, Universität Tübingen, Auf der Morgenstelle 18, 72076 Tübingen, Germany.
Chemistry. 2009;15(4):936-46. doi: 10.1002/chem.200801213.
A general method for the functionalization of silica surfaces with silicon hydride (Si-H) groups is described for four different preparations of silica. The silica surface is reduced in a two-step chlorination-reduction procedure within a simple gas-flow system at high temperatures. After initial dehydroxylation of the silica surface, silicon chloride groups are formed by the reaction with thionyl chloride. The chlorination activates otherwise inaccessible surface siloxane moieties. A high silicon-hydride surface concentration results from the subsequent reduction of the chlorinated surface with hydrogen. The physical properties of the resulting silica are analyzed using scanning electron microscopy, as well as dynamic light scattering and Brunauer-Emmet-Teller measurements. The chlorination-reduction sequence has no significant impact on the structure, surface area and mesopore size of the silica materials used. The surface of the materials is characterized by diffuse reflectance infrared Fourier transform (DRIFT) and (29)Si CP/MAS NMR spectroscopy. The silicon-hydride groups are mostly of the ${{\rm T}{{3\hfill \atop {\rm H}\hfill}}}$-type. The use of high temperatures (>800 degrees C) results in the condensation of internal and surface silanol groups. Therefore, materials with both a fully condensed silica matrix as well as a surface free of silanol groups are obtained. The materials are ideal precursors for further molecular silica surface modification, as demonstrated with a ferrocene derivative.
本文描述了一种用硅氢化物(Si-H)基团对二氧化硅表面进行功能化的通用方法,该方法适用于四种不同的二氧化硅制备物。在一个简单的高温气流系统中,通过两步氯化-还原程序对二氧化硅表面进行还原。在二氧化硅表面初步脱羟基后,与亚硫酰氯反应形成氯化硅基团。氯化反应激活了原本难以接近的表面硅氧烷部分。随后用氢气还原氯化后的表面,从而得到高硅氢化物表面浓度。使用扫描电子显微镜以及动态光散射和布鲁诺尔-埃米特-泰勒测量法对所得二氧化硅的物理性质进行分析。氯化-还原序列对所用二氧化硅材料的结构、表面积和中孔尺寸没有显著影响。通过漫反射红外傅里叶变换(DRIFT)和(29)Si CP/MAS NMR光谱对材料表面进行表征。硅氢化物基团大多为${{\rm T}{{3\hfill \atop {\rm H}\hfill}}}$型。高温(>800摄氏度)的使用导致内部和表面硅醇基团缩合。因此,得到了具有完全缩合的二氧化硅基质以及无硅醇基团表面的材料。如用二茂铁衍生物所证明的那样,这些材料是进一步进行分子二氧化硅表面改性的理想前体。