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通过X射线辐照对有机二聚体莫特绝缘体κ-(BEDT-TTF)₂Cu[N(CN)₂]Cl进行载流子掺杂的光学探针

Optical probe of carrier doping by X-ray irradiation in the organic dimer Mott insulator kappa-(BEDT-TTF)_{2}Cu[N(CN)_{2}]Cl.

作者信息

Sasaki T, Yoneyama N, Nakamura Y, Kobayashi N, Ikemoto Y, Moriwaki T, Kimura H

机构信息

Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan.

出版信息

Phys Rev Lett. 2008 Nov 14;101(20):206403. doi: 10.1103/PhysRevLett.101.206403.

Abstract

We investigated the infrared optical spectra of an organic dimer Mott insulator kappa-(BEDT-TTF){2}Cu[N(CN){2}]Cl, which was irradiated with x rays. We observed that the irradiation caused a large spectral weight transfer from the midinfrared region, where interband transitions in the dimer and Mott-Hubbard bands take place, to a Drude part in a low-energy region; this caused the Mott gap to collapse. The increase of the Drude part indicates a carrier doping into the Mott insulator due to irradiation defects. The strong redistribution of the spectral weight demonstrates that the organic Mott insulator is very close to the phase border of the bandwidth-controlled Mott-insulator-metal transition.

摘要

我们研究了经X射线辐照的有机二聚体莫特绝缘体κ-(BEDT-TTF)₂Cu[N(CN)₂]Cl的红外光谱。我们观察到,辐照导致光谱权重从二聚体和莫特-哈伯德带中的带间跃迁发生的中红外区域大幅转移到低能区域的德鲁德部分;这导致莫特能隙崩塌。德鲁德部分的增加表明由于辐照缺陷,载流子被掺杂到莫特绝缘体中。光谱权重的强烈重新分布表明,有机莫特绝缘体非常接近带宽控制的莫特绝缘体-金属转变的相边界。

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