Dlubek G, Shaikh M Q, Raetzke K, Faupel F, Pionteck J, Paluch M
ITA Institute for Innovative Technologies, Kothen/Halle, Wiesenring 4, D-06120 Lieskau (Halle/S.), Germany.
J Chem Phys. 2009 Apr 14;130(14):144906. doi: 10.1063/1.3115424.
Positron annihilation lifetime spectroscopy (PALS) and pressure-volume-temperature (PVT) experiments were performed to characterize the temperature dependent microstructure of the hole free volume in the low molecular weight glass-former phenyl salicylate (salol). The PALS spectra were analyzed with the new routine LT9.0 and the volume distribution of subnanometer size holes characterized by its mean <v(h)> and standard deviation sigma(h) was calculated. Crystallization of the amorphous sample was observed in the temperature range above 250 K, which leads to a vanishing of the positronium formation. The positronium signal recovered after melting at 303 K. A combination of PALS with PVT data enabled us to calculate the specific density N(h)('), the specific volume V(f), and the fraction of holes f(h) in the amorphous state. From comparison with dielectric measurements in the temperature range above T(B)=265 K, it was found that the primary structural relaxation slows down with temperature, faster than the shrinkage of the hole free volume V(f) would predict, on the basis of the Cohen-Turnbull (CT) free volume theory. CT plots can be linearized by replacing V(f) of the CT theory by (V(f)-DeltaV), where DeltaV is a volume correction term. This was interpreted as indication that the lower wing of the hole size distribution contains holes too small to show a liquidlike behavior in their surroundings. Peculiarities of the relaxation behavior below T(B)=265 K and the possible validity of the Cohen-Grest free volume model are discussed.
进行了正电子湮没寿命谱(PALS)和压力-体积-温度(PVT)实验,以表征低分子量玻璃形成剂水杨酸苯酯(萨罗)中无孔自由体积的温度依赖性微观结构。使用新程序LT9.0分析PALS光谱,并计算以其平均<v(h)>和标准偏差sigma(h)表征的亚纳米尺寸孔的体积分布。在高于250 K的温度范围内观察到非晶样品的结晶,这导致正电子形成消失。在303 K熔化后,正电子信号恢复。PALS与PVT数据的结合使我们能够计算非晶态下的比密度N(h)'、比体积V(f)和孔分数f(h)。通过与高于T(B)=265 K温度范围内的介电测量结果比较发现,基于科恩-特恩布尔(CT)自由体积理论,主结构弛豫随温度减慢的速度比无孔自由体积V(f)的收缩所预测的要快。通过用(V(f)-DeltaV)代替CT理论中的V(f),CT图可以线性化,其中DeltaV是一个体积校正项。这被解释为表明孔尺寸分布的下翼包含太小以至于在其周围环境中无法表现出类似液体行为的孔。讨论了低于T(B)=265 K时弛豫行为的特殊性以及科恩-格雷斯特自由体积模型的可能有效性。