极紫外自由电子激光辐射引发的N₂的少光子多电离
Few-photon multiple ionization of N2 by extreme ultraviolet free-electron laser radiation.
作者信息
Jiang Y H, Rudenko A, Kurka M, Kühnel K U, Ergler Th, Foucar L, Schöffler M, Schössler S, Havermeier T, Smolarski M, Cole K, Dörner R, Düsterer S, Treusch R, Gensch M, Schröter C D, Moshammer R, Ullrich J
机构信息
Max-Planck-Institut für Kernphysik, 69117 Heidelberg, Germany.
出版信息
Phys Rev Lett. 2009 Mar 27;102(12):123002. doi: 10.1103/PhysRevLett.102.123002. Epub 2009 Mar 25.
Few-photon multiple ionization of N2 was studied differentially in a reaction microscope using 44 eV, approximately 25 fs, intense ( approximately 10(13) W/cm(2)) photon pulses from FLASH. Sequential ionization is observed to dominate. For various intermediate charge states N(2)(n+0 we find a considerable excess of photons absorbed compared to the minimum number that would energetically be required. Photoionization of aligned N(2)(n+) ions, produced by photon absorption in sequential steps, is explored and few-photon absorption pathways are traced by inspecting kinetic energy releases and fragment-ion angular distributions.
利用来自FLASH的44电子伏特、约25飞秒、高强度（约10¹³瓦/平方厘米）的光子脉冲，在反应显微镜中对N₂的少光子多电离进行了微分研究。观察到顺序电离占主导。对于各种中间电荷态N₂ⁿ⁺，我们发现与能量上所需的最小光子数相比，吸收的光子有相当大的过量。研究了通过顺序步骤中的光子吸收产生的取向N₂ⁿ⁺离子的光电离，并通过检查动能释放和碎片离子角分布来追踪少光子吸收途径。
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