Stinton Graham W, Evans John S O
Department of Chemistry, University of Durham, UK.
J Appl Crystallogr. 2007 Feb 1;40(Pt 1):87-95. doi: 10.1107/S0021889806043275. Epub 2007 Jan 12.
In this paper the method of parametric Rietveld refinement is described, in which an ensemble of diffraction data collected as a function of time, temperature, pressure or any other variable are fitted to a single evolving structural model. Parametric refinement offers a number of potential benefits over independent or sequential analysis. It can lead to higher precision of refined parameters, offers the possibility of applying physically realistic models during data analysis, allows the refinement of 'non-crystallographic' quantities such as temperature or rate constants directly from diffraction data, and can help avoid false minima.
本文描述了参数化里特韦尔德精修方法,其中将作为时间、温度、压力或任何其他变量的函数收集的一组衍射数据拟合到单个演化的结构模型。与独立或顺序分析相比,参数化精修具有许多潜在优势。它可以提高精修参数的精度,在数据分析过程中提供应用物理现实模型的可能性,允许直接从衍射数据中精修诸如温度或速率常数等“非晶体学”量,并有助于避免错误的极小值。