Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA.
J Phys Chem B. 2009 Nov 12;113(45):15040-6. doi: 10.1021/jp9070746.
We show that proton conductance variation in Nafion membranes can be mapped using current sensing atomic force microscopy (CSAFM) to reveal and to characterize the heterogeneity in proton transport properties of the membranes. The distribution obtained by using a conventional CSAFM probe tip coated with a catalyst layer on a fresh Nafion membrane under a humid condition always displays a Gaussian-like shape. Such a feature can be explained in terms of the size of the contact area between a CSAFM tip and the membrane in comparison to the size of the tip apex. The conductance of individual proton channels and the density of the channels can be derived from the distribution. The averaged conductance and the density of proton channels derived are found to be consistent with that obtained in a recent simulation work based on the small-angle X-ray scattering (SAXS) data.
我们表明,使用电流感应原子力显微镜 (CSAFM) 可以映射 Nafion 膜中的质子传导变化,以揭示和表征膜中质子传输性质的异质性。在潮湿条件下,使用涂有催化剂层的传统 CSAFM 探针尖端在新鲜 Nafion 膜上获得的分布始终显示高斯形状。这种特征可以根据 CSAFM 探针尖端与膜之间的接触面积与尖端顶点的大小来解释。可以从分布中得出单个质子通道的电导和通道密度。得出的平均电导和质子通道密度与基于小角 X 射线散射 (SAXS) 数据的最近模拟工作中获得的结果一致。