Tsai Yu-Ju, Degiron Aloyse, Jokerst Nan M, Smith David R
Center for Metamaterials and Integrated Plasmonics, Department of Electrical and Computer Engineering, Duke University, Durham, NC 27708, USA.
Opt Express. 2009 Sep 28;17(20):17471-82. doi: 10.1364/OE.17.017471.
Plasmonic multi-mode interference (MMI) couplers have been investigated both numerically and experimentally at the telecommunication wavelength of 1.55 mum. In this study, the couplers are implemented using thin Au stripes that support long-range surface plasmons. We first detail the operation principle of these devices with numerical simulations and show that useful effects can be obtained despite the high material losses inherent to metallic structures. A series of MMI couplers is subsequently fabricated and experimentally characterized, showing a quantitative agreement with our numerical predictions. We conclude by discussing some of the possible applications for these structures.
等离子体多模干涉(MMI)耦合器已在1.55微米的电信波长下进行了数值和实验研究。在本研究中,耦合器是使用支持长程表面等离子体的薄金条纹实现的。我们首先通过数值模拟详细阐述了这些器件的工作原理,并表明尽管金属结构存在固有的高材料损耗,但仍可获得有用的效果。随后制作了一系列MMI耦合器并进行了实验表征,结果与我们的数值预测在定量上相符。我们通过讨论这些结构的一些可能应用来得出结论。