一种用于垂直入射时同时进行透射和反射测量的太赫兹时域光谱仪。

A terahertz time-domain spectrometer for simultaneous transmission and reflection measurements at normal incidence.

作者信息

Brunner Fabian D J, Schneider Arno, Günter Peter

机构信息

Nonlinear Optics Laboratory, Institute of Quantum Electronics, ETH Zurich, 8093 Zurich, Switzerland.

出版信息

Opt Express. 2009 Nov 9;17(23):20684-93. doi: 10.1364/OE.17.020684.

DOI:10.1364/OE.17.020684

PMID:19997298

Abstract

We present a versatile terahertz time-domain spectrometer which allows reflection measurements at normal incidence and double pass transmission measurements in a single experimental setup. Two different modes for transmission measurements are demonstrated for precise measurements of transparent high or low refractive index materials, respectively. The refractive indices and absorption coefficients of cesium iodide, potassium bromide, sodium chloride, polytetrafluoroethylene (PTFE, Teflon), and silicon have been measured in the frequency range between 1.4 and 4.7 THz. The parameters of the Lorentz oscillator functions describing the phonon polariton dispersions of CsI and KBr have been determined.

摘要

我们展示了一种多功能太赫兹时域光谱仪，它能够在单个实验装置中进行垂直入射反射测量和双程透射测量。分别展示了两种不同的透射测量模式，用于精确测量透明高折射率或低折射率材料。已在1.4至4.7太赫兹的频率范围内测量了碘化铯、溴化钾、氯化钠、聚四氟乙烯（PTFE，特氟龙）和硅的折射率和吸收系数。已确定了描述CsI和KBr声子极化激元色散的洛伦兹振子函数的参数。