Li Qing, Soltani Mohammad, Atabaki Amir H, Yegnanarayanan Siva, Adibi Ali
School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Drive NW, Atlanta, GA 30332-0250, USA.
Opt Express. 2009 Dec 21;17(26):23474-87. doi: 10.1364/OE.17.023474.
We present a detailed study on the behavior of coupling-induced resonance frequency shift (CIFS) in dielectric microring resonators. CIFS is related to the phase responses of the coupling region of the resonator coupling structure, which are examined for various geometries through rigorous numerical simulations. Based on the simulation results, a model for the phase responses of the coupling structure is presented and verified to agree with the simulation results well, in which the first-order coupled mode theory (CMT) is extended to second order, and the important contributions from the inevitable bent part of practical resonators are included. This model helps increase the understanding of the CIFS behavior and makes the calculation of CIFS for practical applications without full numerical simulations possible.
我们对介质微环谐振器中耦合诱导共振频率偏移（CIFS）的行为进行了详细研究。CIFS与谐振器耦合结构耦合区域的相位响应有关，通过严格的数值模拟对各种几何形状进行了研究。基于模拟结果，提出了一种耦合结构相位响应模型，并验证其与模拟结果吻合良好，该模型将一阶耦合模理论（CMT）扩展到二阶，并考虑了实际谐振器不可避免的弯曲部分的重要贡献。该模型有助于加深对CIFS行为的理解，并使得在无需进行完整数值模拟的情况下对实际应用中的CIFS进行计算成为可能。
