Department of Chemistry, University of California, One Shields Ave., Davis, CA 95616, USA.
Dalton Trans. 2010 Jan 28;39(4):1055-62. doi: 10.1039/b920250a. Epub 2009 Nov 30.
The Zintl phase Yb(14)MnSb(11) was successfully doped with Ge utilizing a tin flux technique. The stoichiometry was determined by microprobe analysis to be Yb(13.99(14))Mn(1.05(5))Sb(10.89(16))Ge(0.06(3)). This was the maximum amount of Ge that could be incorporated into the structure via flux synthesis regardless of the amount included in the reaction. Single crystal X-ray diffraction could not unambiguously determine the site occupancy for Ge. Bond lengths varied by about 1% or less, compared with the undoped structure, suggesting that the small amount of Ge dopant does not significantly perturb the structure. Differential scanning calorimetry/thermogravimetry (DSC/TG) show that the doped compound's melting point is greater than 1200 K. The electrical resistivity and magnetism are virtually unchanged from the parent material, suggesting that Yb is present as Yb(2+) and that the Ge dopant has little effect on the magnetic structure. At 900 K the resistivity and Seebeck coefficient decrease resulting in a zT of 0.45 at 1100 K, significantly lower than the undoped compound.
利用锡流技术成功地在 Zintl 相 Yb(14)MnSb(11)中掺杂 Ge。通过微探针分析确定化学计量比为 Yb(13.99(14))Mn(1.05(5))Sb(10.89(16))Ge(0.06(3))。这是通过通量合成可以掺入到结构中的最大 Ge 量,无论反应中包含多少。单晶 X 射线衍射不能明确确定 Ge 的占位情况。与未掺杂结构相比,键长变化约为 1%或更小,表明少量的 Ge 掺杂剂不会显著干扰结构。差示扫描量热法/热重法(DSC/TG)表明,掺杂化合物的熔点大于 1200 K。电阻率和磁化率与母体材料几乎没有变化,表明 Yb 以 Yb(2+)存在,并且 Ge 掺杂剂对磁结构几乎没有影响。在 900 K 时,电阻率和塞贝克系数下降,导致在 1100 K 时的 zT 为 0.45,明显低于未掺杂的化合物。