Reisinger A
Appl Opt. 1973 May 1;12(5):1015-25. doi: 10.1364/AO.12.001015.
A number of analysis techniques aimed at determining the characteristics of optical guided waves propagating in lossy structures are examined. The exact theory is used as a guide to assess the validity of several approximate methods based on two basic approaches: (a) geometrical optics and (b) perturbation calculations. The limitations of the conventional perturbation techniques are specified. We present a generalized procedure that permits an accurate description of metal boundaries at optical frequencies. In this case, TM modes differ from their TE counterparts by a field buildup near conducting walls and by the existence of an additional surface plasma mode. The dependence of attenuation coefficients on film thickness and mode order are discussed. The use of low-index dielectric buffers to reduce ohmic losses is considered. It is found that, with increasing buffer thickness, TM(N) modes undergo a continuous transformation to become TM(N+1).
研究了多种旨在确定在有损结构中传播的光导波特性的分析技术。精确理论被用作指导,以评估基于两种基本方法的几种近似方法的有效性:(a)几何光学和(b)微扰计算。明确了传统微扰技术的局限性。我们提出了一种通用程序,该程序能够准确描述光频下的金属边界。在这种情况下,TM模式与它们的TE对应模式的不同之处在于导电壁附近的场增强以及存在额外的表面等离子体模式。讨论了衰减系数对薄膜厚度和模式阶数的依赖性。考虑了使用低折射率介质缓冲层来降低欧姆损耗。结果发现,随着缓冲层厚度的增加,TM(N)模式会经历连续转变,变为TM(N+1)。