Alvarez Natalia, Perez-Quintián Fernando
Laboratorio de Aplicaciones Opticas, Facultad de Ingeniería, Universidad de Buenos Aires, Avenue Paseo Colón 850, C1063ACU, Buenos Aires, Argentina.
Appl Opt. 2010 Mar 10;49(8):1335-40. doi: 10.1364/AO.49.001335.
The speckle grain close to a diffuser medium carries information about the angles at which light is scattered. We propose the extension of a technique that allows obtaining the angular distribution of the scattered intensity in the far-field speckle pattern from the near-field speckle pattern produced by strong diffusers (whose roughness is greater than the illuminating wavelength). To illustrate this technique we applied it to the light scattered from ground glass diffusers. The experimental results are compared with those obtained by direct measurement of the angular distribution of the mean scattered intensity in the far field showing good agreement with each other. The advantages over the classical far-field methods are outlined.
靠近散射介质的散斑颗粒携带有关光散射角度的信息。我们提出了一种技术扩展,该技术能够从由强散射体(其粗糙度大于照明波长)产生的近场散斑图案中获取远场散斑图案中散射强度的角分布。为了说明该技术,我们将其应用于从毛玻璃散射体散射的光。将实验结果与通过直接测量远场中平均散射强度的角分布所获得的结果进行比较,结果显示二者吻合良好。文中还概述了该技术相对于传统远场方法的优势。