Elson J M, Rahn J P, Bennett J M
Appl Opt. 1980 Mar 1;19(5):669-79. doi: 10.1364/AO.19.000669.
Measurements of angular scattering due to surface roughness were taken from a 24-layer dielectric mirror and compared to theory. In addition, the top surface roughness of the multilayer stack is analyzed from Talystep profilometer measurements. These roughness data are used to obtain a roughness spectral density function to be used in a vector multilayer scattering theory. The theory uses three multilayer stack models to incorporate possible effects of different degrees of correlation between interfaces of the stack. It was found that the angular scattering calculated using the experimentally obtained roughness spectral density function agreed remarkably well with the measured angular scattering data. This is especially true if care is taken to differentiate between particulate and roughness scattering. For the sake of comparison, the angular scattering from an aluminum film is also given, and differences from scattering from the multilayer mirror are noted.
对一个24层介质镜的表面粗糙度引起的角散射进行了测量,并与理论进行了比较。此外,通过Talystep轮廓仪测量分析了多层堆叠结构的顶面粗糙度。这些粗糙度数据用于获得粗糙度谱密度函数,以用于矢量多层散射理论。该理论使用三种多层堆叠模型来考虑堆叠结构界面之间不同程度相关性的可能影响。结果发现,使用实验获得的粗糙度谱密度函数计算出的角散射与测量的角散射数据非常吻合。如果注意区分颗粒散射和粗糙度散射,情况尤其如此。为了进行比较,还给出了铝膜的角散射,并指出了与多层镜散射的差异。