Department of Chemistry and Biochemistry, Montana State University, Bozeman, MT 59717, USA.
ACS Appl Mater Interfaces. 2009 Mar;1(3):653-60. doi: 10.1021/am800186m.
A combination of beam-surface-scattering, quartz-crystal-microbalance, and surface-recession experiments was conducted to study the effects of various combinations of O atoms [in the O((3)P) ground state], Ar atoms, and vacuum ultraviolet (VUV) light on fluorinated ethylene-propylene copolymer (FEP) Teflon and poly(methyl methacrylate) (PMMA). A laser-breakdown source was used to create hyperthermal beams containing O and O(2) or Ar. A D(2) lamp provided a source of VUV light. O atoms with 4 eV of translational energy or less did not react with a pristine FEP Teflon surface. Volatile O-containing reaction products were observed when the O-atom energy was higher than 4.5 eV, and the signal increased with the O-atom energy. Significant erosion of FEP Teflon ( approximately 20% of Kapton H) was observed when it was exposed to the hyperthermal O/O(2) beam with an average O-atom energy of 5.4 eV. FEP Teflon and PMMA that were exposed to VUV light alone exhibited much less mass loss. Collision-induced dissociation by hyperthermal Ar atoms also caused mass loss, similar in magnitude to that caused by VUV light. There were no observed synergistic effects when VUV light or Ar bombardment was combined with O/O(2) exposure. For both FEP Teflon and PMMA, the erosion yields caused by simultaneous exposure to O/O(2) and either VUV light or Ar atoms could be approximately predicted by adding the erosion yield caused by O/O(2), acting individually, to the erosion yield caused by the individual action of either VUV light or Ar atoms.
采用束-表面散射、石英晶体微天平以及表面侵蚀实验相结合的方法,研究了不同组合的 O 原子(处于 O((3)P)基态)、Ar 原子和真空紫外光(VUV)对氟化乙烯丙烯共聚物(FEP)特氟龙和聚甲基丙烯酸甲酯(PMMA)的影响。激光击穿源用于产生含有 O 和 O(2)或 Ar 的超热束。D(2)灯提供 VUV 光源。具有 4 eV 以下平移能量的 O 原子与原始 FEP 特氟龙表面不发生反应。当 O 原子能量高于 4.5 eV 时,观察到含有 O 的挥发性反应产物,并且信号随 O 原子能量的增加而增加。当暴露于平均 O 原子能量为 5.4 eV 的超热 O/O(2)束时,FEP 特氟龙(约为 Kapton H 的 20%)发生了明显的侵蚀。单独暴露于 VUV 光的 FEP 特氟龙和 PMMA 表现出的质量损失要小得多。超热 Ar 原子的碰撞诱导解离也会导致质量损失,其大小与 VUV 光引起的质量损失相似。当 VUV 光或 Ar 轰击与 O/O(2)暴露结合时,没有观察到协同效应。对于 FEP 特氟龙和 PMMA,同时暴露于 O/O(2)和 VUV 光或 Ar 原子时引起的侵蚀产率,可以通过将 O/O(2)单独作用引起的侵蚀产率与 VUV 光或 Ar 原子单独作用引起的侵蚀产率相加来近似预测。