Bitzer Andreas, Ortner Alex, Walther Markus
Freiburg Materials Research Center, University of Freiburg, Stefan-Meier-Strasse 21, D-79104 Freiburg, Germany.
Appl Opt. 2010 Jul 1;49(19):E1-6. doi: 10.1364/AO.49.0000E1.
Imaging and sensing applications based on pulsed terahertz radiation have opened new possibilities for scientific and industrial applications. Many exploit the unique features of the terahertz (THz) spectral region, where common packaging materials are transparent and many chemical compounds show characteristic absorptions. Because of their diffraction limit, THz far-field imaging techniques lack microscopic resolution and, if subwavelength features have to be resolved, near-field techniques are required. Here, we present a THz near-field microscopy approach based on photoconductive antennas as the THz emitter and as a near-field probe. Our system allows us to measure amplitude, phase, and polarization of the electric fields in the vicinity of a sample with a spatial resolution on the micrometer scale (approximately lambda/20). Using a dielectric (plant leaf) and a metallic structure (microwire) as examples, we demonstrate the capabilities of our approach.
基于脉冲太赫兹辐射的成像和传感应用为科学和工业应用开辟了新的可能性。许多应用利用了太赫兹(THz)光谱区域的独特特性,在该区域中,常见的包装材料是透明的,并且许多化合物表现出特征吸收。由于其衍射极限,太赫兹远场成像技术缺乏微观分辨率,并且如果要分辨亚波长特征,则需要近场技术。在这里,我们提出了一种基于光电导天线作为太赫兹发射器和近场探头的太赫兹近场显微镜方法。我们的系统使我们能够在微米尺度(约为λ/20)的空间分辨率下测量样品附近电场的幅度、相位和极化。以电介质(植物叶片)和金属结构(微线)为例,我们展示了我们方法的能力。