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光解分解 N-卤胺抗菌硅氧烷涂层的机理。

Mechanism of photolytic decomposition of N-halamine antimicrobial siloxane coatings.

机构信息

Department of Polymer and Fiber Engineering, Auburn University, Auburn, Alabama 36849, USA.

出版信息

ACS Appl Mater Interfaces. 2010 Aug;2(8):2456-64. doi: 10.1021/am100511x.

Abstract

Generally, antimicrobial N-halamine siloxane coatings can be rehalogenated repetitively upon loss of their biocidal efficacies, a marked advantage over coatings containing other antimicrobial materials. However, the N-halamine materials tend to slowly decompose upon exposure to ultraviolet irradiation as in direct sunlight. In this work the mechanism of photolytic decomposition for the N-halamine siloxanes has been studied using spectroscopic and theoretical methods. It was found that the N-chlorinated coatings slowly decomposed upon UVA irradiation, whereas the unhalogenated coatings did not. Model compound evidence in this work suggests that upon UVA irradiation, the N-Cl bond dissociates homolytically, followed by a Cl radical migration to the alkyl side chain connected to the siloxane tethering group. An alpha and/or beta scission then occurs causing partial loss of the biocidal moiety from the surface of the coated material, thus precluding complete rechlorination. NMR, FTIR, GCMS, and computations at the DFT (U)B3LYP/6-311++G(2d,p) level of theory have been employed in reaching this conclusion.

摘要

一般来说,抗菌 N-卤胺硅氧烷涂层在失去杀菌效果后可以重复再卤化,这是优于含有其他抗菌材料的涂层的显著优势。然而,N-卤胺材料在暴露于紫外线照射(如阳光直射)时往往会缓慢分解。在这项工作中,使用光谱和理论方法研究了 N-卤胺硅氧烷的光解分解机制。结果发现,N-氯化涂层在 UVA 照射下缓慢分解,而未卤化的涂层则不会。这项工作中的模型化合物证据表明,在 UVA 照射下,N-Cl 键均裂解离,随后 Cl 自由基迁移到与硅氧烷连接基团相连的烷基侧链。然后发生α和/或β断裂,导致杀菌部分从涂层材料表面部分损失,从而阻止完全再氯化。这项结论是通过 NMR、FTIR、GCMS 和 DFT(U)B3LYP/6-311++G(2d,p)理论水平的计算得出的。

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