Department of Chemistry & Chemical Biology, McMaster University, Hamilton, ON, Canada L8S 4M1.
Langmuir. 2010 Sep 21;26(18):14759-65. doi: 10.1021/la102432g.
Synchrotron-based X-ray photoemission electron microscopy (X-PEEM) and atomic force microscopy (AFM) were used to characterize the composition and surface morphology of thin films of a polystyrene-poly(ethylene oxide) blend (PS-PEO), spun cast from dichloromethane at various mass ratios and polymer concentrations. X-PEEM reveals incomplete segregation with ∼30% of PS in the PEO region and vice versa. Protein (human serum albumin) adsorption studies show that this partial phase separation leads to greater protein repellency in the PS region, whereas more protein is detected in the PEO region compared to control samples.
基于同步加速器的 X 射线光电子能谱电子显微镜 (X-PEEM) 和原子力显微镜 (AFM) 被用于表征聚苯乙烯-聚氧化乙烯共混物 (PS-PEO) 薄膜的组成和表面形貌,该薄膜是通过将二氯甲烷以不同的质量比和聚合物浓度旋涂而成的。X-PEEM 揭示了不完全的相分离,其中约 30%的 PS 在 PEO 区域,反之亦然。蛋白质 (人血清白蛋白) 吸附研究表明,这种部分相分离导致 PS 区域对蛋白质的排斥性更强,而与对照样品相比,更多的蛋白质被检测到在 PEO 区域。