Gisin N, Passy R, Stamp P, Hori N, Nagano S
Appl Opt. 1994 Mar 20;33(9):1726-31. doi: 10.1364/AO.33.001726.
A direct and nondestructive measurement technique for the determination of the refractive index profiles of one- and two-dimensional LiNbO(3) waveguides is presented for the first time to our knowledge. The technique generalizes the refracted near-field method, which is well known for optical fiber characterization. The spatial resolution and accuracy are 0.1 and 0.4 µm, respectively. The refractive-index calibration is done by an analysis of the near-field light power distribution, and its resolution is approximately 2 × 10(-4). The proposed experimental setup permits sample installation and data acquisition in a few minutes.
据我们所知,首次提出了一种用于确定一维和二维铌酸锂(LiNbO₃)波导折射率分布的直接且无损的测量技术。该技术推广了折射近场法,折射近场法在光纤特性表征方面广为人知。空间分辨率和精度分别为0.1 µm和0.4 µm。通过对近场光功率分布的分析进行折射率校准,其分辨率约为2×10⁻⁴。所提出的实验装置允许在几分钟内完成样品安装和数据采集。