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基于消逝波腔的光谱技术作为界面过程的探针。

Evanescent wave cavity-based spectroscopic techniques as probes of interfacial processes.

机构信息

Department of Chemistry, University of Warwick, Gibbet Hill Road, Coventry, CV4 7AL, UK.

出版信息

Chem Soc Rev. 2011 Jan;40(1):207-20. doi: 10.1039/c0cs00017e. Epub 2010 Sep 30.

Abstract

Evanescent wave cavity ring-down spectroscopy (EW-CRDS) is a surface sensitive technique, which allows optical absorption measurements at interfaces with good time resolution. In EW-CRDS, a pulsed or modulated laser beam is coupled into an optical cavity which consists of at least one optical element, such as a silica prism, at the surface of which the beam undergoes total internal reflection (TIR). At the position of TIR, an evanescent field is established whose amplitude decays exponentially with distance from the boundary. This evanescent field can be exploited to investigate interfacial properties and processes such as adsorption and surface reactions, with most applications hitherto focusing on solid/liquid and solid/air interfaces. As highlighted herein, EW-CRDS is particularly powerful for investigations of interfacial processes when combined with other techniques such as basic electrochemical measurements and microfluidic or hydrodynamic techniques. In this tutorial review, the basic elements of EW-CRDS will be introduced and the relative merits of different configurations for EW-CRDS discussed, along with various aspects of instrumentation and design. The type of information which may be obtained using EW-CRDS is illustrated with a focus on recent examples such as molecular adsorption/desorption, deposition/dissolution of nanostructures and interfacial redox reactions. The comparatively new, but complementary, cavity technique of EW-broadband cavity enhanced absorption spectroscopy (EW-BB-CEAS) is also introduced and its advantages compared with EW-CRDS are discussed. Finally, future developments and trends in EW-cavity based spectroscopy are predicted. Notably, the potential for extending the technique to probe other interfaces is exemplified with a discussion of initial interfacial absorbance measurements at a water-air interface.

摘要

消逝波腔衰荡光谱(EW-CRDS)是一种表面敏感技术,可在具有良好时间分辨率的界面进行光学吸收测量。在 EW-CRDS 中,脉冲或调制激光束耦合到光学腔中,该光学腔至少由一个光学元件组成,例如在其表面发生全内反射(TIR)的硅棱镜。在 TIR 的位置处,建立了一个消逝场,其幅度随离边界的距离呈指数衰减。可以利用这个消逝场来研究界面性质和过程,例如吸附和表面反应,迄今为止,大多数应用都集中在固/液和固/气界面上。如本文所强调的,当与其他技术(例如基本电化学测量和微流控或流体动力学技术)结合使用时,EW-CRDS 特别适合于界面过程的研究。在本教程综述中,将介绍 EW-CRDS 的基本要素,并讨论不同 EW-CRDS 配置的相对优点,以及仪器和设计的各个方面。使用 EW-CRDS 可以获得的信息类型将通过重点介绍最近的示例进行说明,例如分子吸附/解吸、纳米结构的沉积/溶解和界面氧化还原反应。还介绍了相对较新但互补的 EW-宽带腔增强吸收光谱(EW-BB-CEAS)腔技术,并讨论了其与 EW-CRDS 的优点。最后,预测了 EW 腔基光谱学的未来发展和趋势。值得注意的是,通过讨论在水-气界面处的初始界面吸收测量,说明了将该技术扩展到探测其他界面的潜力。

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