Department of Engineering Mechanics, China University of Petroleum, Qingdao 266555, PR China.
Langmuir. 2011 Jan 4;27(1):196-200. doi: 10.1021/la103652s. Epub 2010 Nov 30.
The classical Wenzel and Cassie models fail to give a physical explanation of such phenomenon as the macroscopic contact angle actually being equal to the Young's contact angle if there is a spot (surface defect) inside the droplet. Here, we derive the expression of the macroscopic contact angle for this special substrate in use of the principle of least potential energy, and our analytical results are in good agreement with the experimental data. Our findings also suggest that it is the triple contact line (TCL) rather than the contact area that dominates the contact angle. Therefore a new model based upon the TCL pinning is developed to explain the different wetting properties of the Wenzel and Cassie models for hydrophilic and hydrophobic cases. Moreover, the new model predicts the macroscopic contact angle in a broader range accurately, which is consistent with the existing experimental findings. This study revisits the fundamentals of wetting on rough substrates. The new model derived will help to design better superhydrophobic materials and provide the prediction required to engineer novel microfluidic devices.
如果液滴内部存在一个点(表面缺陷),那么经典的 Wenzel 和 Cassie 模型无法对宏观接触角实际上等于杨氏接触角的现象给出物理解释。在这里,我们利用最小势能原理推导出了这种特殊基底的宏观接触角表达式,我们的分析结果与实验数据吻合得很好。我们的发现还表明,是三相接触线(TCL)而不是接触面积主导着接触角。因此,我们提出了一个基于 TCL 钉扎的新模型,以解释亲水和疏水情况下 Wenzel 和 Cassie 模型的不同润湿特性。此外,新模型能够准确地预测更广泛范围内的宏观接触角,这与现有的实验结果一致。这项研究重新审视了粗糙基底上的润湿基础。所推导的新模型将有助于设计更好的超疏水材料,并提供设计新型微流控器件所需的预测。