Kamaruddin Sharul Ashikin, Chan Kah-Yoong, Sahdan Mohd Zainizan, Rusop Mohamad, Saim Hashim
Faculty of Engineering, Multimedia University, 63100 Cyberjaya, Selangor, Malaysia.
J Nanosci Nanotechnol. 2010 Sep;10(9):5618-22. doi: 10.1166/jnn.2010.2444.
Zinc oxide (ZnO) is an emerging material in large area electronic applications such as thin-film solar cells and transistors. We report on the fabrication and characterization of ZnO microstructures and nanostructures. The ZnO microstructures and nanostructures have been synthesized using sol-gel immerse technique on oxidized silicon substrates. Different precursor's concentrations ranging from 0.0001 M to 0.01 M (M=molarity) using zinc nitrate hexahydrate [Zn(NO3)2. 6H2O] and hexamethylenetetramine [C6H12N4] were employed in the synthesis of the ZnO structures. The surface morphologies were examined using scanning electron microscope (SEM) and atomic force microscope (AFM). In order to investigate the structural properties, the ZnO microstructures and nanostructures were measured using X-ray diffractometer (XRD). The optical properties of the ZnO structures were measured using photoluminescence (PL) and ultraviolet-visible (UV-Vis) spectroscopies.
氧化锌（ZnO）是薄膜太阳能电池和晶体管等大面积电子应用中的一种新兴材料。我们报告了ZnO微结构和纳米结构的制备与表征。ZnO微结构和纳米结构已通过溶胶-凝胶浸渍技术在氧化硅衬底上合成。在ZnO结构的合成中，使用了六水合硝酸锌[Zn(NO3)2·6H2O]和六亚甲基四胺[C6H12N4]，不同前驱体浓度范围为0.0001 M至0.01 M（M = 摩尔浓度）。使用扫描电子显微镜（SEM）和原子力显微镜（AFM）检查表面形貌。为了研究结构性质，使用X射线衍射仪（XRD）对ZnO微结构和纳米结构进行了测量。使用光致发光（PL）和紫外-可见（UV-Vis）光谱对ZnO结构的光学性质进行了测量。
