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粗糙脉孢菌双组分异核体ad-3区域的X射线诱导特异性位点突变。V. 基因型为ad-3A ad-3B、ad-3A ad-3B nic-2和ad-3B nic-2的不可修复突变体是由多位点缺失和意外高频率的多位点突变产生的。

X-ray-induced specific-locus mutations in the ad-3 region of two-component heterokaryons of Neurospora crassa. V. Irreparable mutants of genotype ad-3A ad-3B, ad-3A ad-3B nic-2, and ad-3B nic-2 result from multilocus deletion and an unexpectedly high frequency of multiple-locus mutations.

作者信息

de Serres F J

机构信息

Center for Life Sciences and Toxicology, Chemistry and Life Sciences, Research Triangle Institute, Research Triangle Park, NC 27709.

出版信息

Mutat Res. 1990 Mar;229(1):49-67. doi: 10.1016/0027-5107(90)90008-r.

Abstract

More extensive complementation tests than those performed initially (Webber and de Serres, 1965) on a series of 832 X-ray-induced specific-locus mutations in the adenine-3 (ad-3) region of a two-component heterokaryon (H-12) of Neurospora crassa (de Serres, 1989a) showed that unexpectedly high frequencies of specific-locus mutations in the ad-3 region have additional, but separate, sites of recessive lethal (RLCL) damage in the immediately adjacent genetic regions. The frequencies of these X-ray-induced multiple-locus mutants in the ad-3 region are orders of magnitude higher than that expected on the basis of target theory and classical models of chromosome structure during interphase (de Serres, 1989a). Genetic fine structure analyses, by means of homology tests with tester strains carrying genetic markers in the ad-3 and immediately adjacent regions, have been performed to map the presumed multiple-locus mutations. In a previous paper (de Serres, 1989c), X-ray-induced irreparable ad-3 mutants of the following genotypes and numbers (ad-3A or ad-3B were analyzed, and the high frequency of multiple-locus mutations was confirmed. In the present paper, X-ray-induced irreparable ad-3 mutants of the following genotypes and numbers (ad-3A ad-3B, ad-3A ad-3B nic-2, and ad-3B nic-2 have also been subjected to the same genetic fine structure analysis. These experiments, in the previous (de Serres, 1989c) and present papers, were designed to determine the extent of the functional inactivation in the ad-3 and immediately adjacent genetic regions in individual mutants classified as presumptive multilocus deletions or multiple-locus mutations.

摘要

与最初(韦伯和德塞雷斯,1965年)对粗糙脉孢菌(德塞雷斯,1989a)双组分异核体(H - 12)腺嘌呤-3(ad - 3)区域的832个X射线诱导的特定基因座突变所进行的互补测试相比,更广泛的互补测试表明,ad - 3区域中特定基因座突变的意外高频率在紧邻的遗传区域具有额外但独立的隐性致死(RLCL)损伤位点。这些ad - 3区域中X射线诱导的多基因座突变体的频率比基于靶标理论和间期染色体结构经典模型预期的频率高出几个数量级(德塞雷斯,1989a)。已经通过与在ad - 3及其紧邻区域携带遗传标记的测试菌株进行同源性测试来进行遗传精细结构分析,以绘制假定的多基因座突变图谱。在之前的一篇论文(德塞雷斯;1989c)中,分析了以下基因型和数量的X射线诱导的不可修复的ad - 3突变体(分析了ad - 3A或ad - 3B),并证实了多基因座突变的高频率。在本文中,以下基因型和数量的X射线诱导的不可修复的ad - 3突变体(ad - 3A ad - 3B、ad - 3A ad - 3B nic - 2和ad - 3B nic - 2)也进行了相同的遗传精细结构分析。之前(德塞雷斯,1989c)和本文中的这些实验旨在确定被分类为假定多基因座缺失或多基因座突变的单个突变体中ad - 3及其紧邻遗传区域的功能失活程度。

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