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用于未来 X 射线相衬成像的非消色差和连续自成像状态下的四波横向剪切干涉测量法。

Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging.

机构信息

ONERA, The French Aerospace Lab, Chemin de la Huniere, 91761 Palaiseau, France.

出版信息

Opt Lett. 2011 Apr 15;36(8):1398-400. doi: 10.1364/OL.36.001398.

Abstract

We present in this Letter a type of quadriwave lateral shearing interferometer for x-ray phase imaging. This device is based on a phase chessboard, and we take advantage of the large spectrum of the source to produce interferograms with a propagation-invariant contrast. Such a grating has been created for hard x-ray interferometry and experimentally tested on a synchrotron beamline at Soleil.

摘要

我们在这封信件中提出了一种用于 X 射线相位成像的四波横向剪切干涉仪。该设备基于相位棋盘,我们利用光源的大光谱来产生具有传播不变对比度的干涉图。这种光栅已经为硬 X 射线干涉测量法而创建,并在 Soleil 的同步加速器光束线上进行了实验测试。

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