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原位观察尺寸效应对 ZnO 纳米线力学性能的影响。

In situ observation of size-scale effects on the mechanical properties of ZnO nanowires.

机构信息

Department of Mechanical Engineering-Engineering Mechanics, Michigan Technological University, Houghton, MI 49931, USA.

出版信息

Nanotechnology. 2011 Jul 1;22(26):265712. doi: 10.1088/0957-4484/22/26/265712. Epub 2011 May 18.

DOI:10.1088/0957-4484/22/26/265712
PMID:21586815
Abstract

In this investigation, the size-scale in mechanical properties of individual [0001] ZnO nanowires and the correlation with atomic-scale arrangements were explored via in situ high-resolution transmission electron microscopy (TEM) equipped with atomic force microscopy (AFM) and nanoindentation (NI) systems. The Young's modulus was determined to be size-scale-dependent for nanowires with diameter, d, in the range of 40 nm ≤ d ≤ 110 nm, and reached the maximum of ∼ 249 GPa for d = 40 nm. However, this phenomenon was not observed for nanowires in the range of 200 nm ≤ d ≤ 400 nm, where an average constant Young's modulus of ∼ 147.3 GPa was detected, close to the modulus value of bulk ZnO. A size-scale dependence in the failure of nanowires was also observed. The thick ZnO nanowires (d ≥ 200 nm) were brittle, while the thin nanowires (d ≤ 110 nm) were highly flexible. The diameter effect and enhanced Young's modulus observed in thin ZnO nanowires are due to the combined effects of surface relaxation and long-range interactions present in ionic crystals, which leads to much stiffer surfaces than bulk wires. The brittle failure in thicker ZnO wires was initiated from the outermost layer, where the maximum tensile stress operates and propagates along the (0001) planes. After a number of loading and unloading cycles, the highly compressed region of the thinner nanowires was transformed from a crystalline to an amorphous phase, and the region near the neutral zone was converted into a mixture of disordered atomic planes and bent lattice fringes as revealed by high-resolution images.

摘要

在这项研究中,通过配备原子力显微镜 (AFM) 和纳米压痕 (NI) 系统的原位高分辨率透射电子显微镜 (TEM),探索了[0001] ZnO 纳米线的力学性能的尺寸尺度以及与原子尺度排列的相关性。确定了直径为 40nm≤d≤110nm 的纳米线的杨氏模量具有尺寸依赖性,最大可达约 249GPa,对于 d=40nm 的情况。然而,在 200nm≤d≤400nm 的纳米线范围内,并未观察到这种现象,而是检测到平均恒定的杨氏模量约为 147.3GPa,接近体相 ZnO 的模量值。还观察到了纳米线失效的尺寸依赖性。厚的 ZnO 纳米线(d≥200nm)是脆性的,而薄的纳米线(d≤110nm)则具有很高的柔韧性。在薄的 ZnO 纳米线中观察到的直径效应和增强的杨氏模量是由于表面弛豫和离子晶体中存在的远程相互作用的综合影响,这导致表面比体相线材硬得多。较厚的 ZnO 线材的脆性失效是从最外层开始的,最大拉伸应力在最外层起作用并沿(0001)面传播。经过多次加载和卸载循环后,较薄纳米线的高度压缩区域从结晶态转变为非晶态,而中性区附近的区域转变为无序原子平面的混合物和弯曲的晶格条纹,这可以通过高分辨率图像揭示。

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