School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907, USA.
Nanotechnology. 2011 Jul 22;22(29):295504. doi: 10.1088/0957-4484/22/29/295504. Epub 2011 Jun 17.
Cantilevered or suspended nanowires show promise for force or mass sensing applications due to their small mass, high force sensitivity and high frequency bandwidth. To use these as quantitative sensors, their bending stiffness or mass must be calibrated experimentally, often using thermally driven vibration. However, this can be difficult because nanowires are slightly asymmetric, which results in two spatially orthogonal bending eigenmodes with closely spaced frequencies. This asymmetry presents problems for traditional stiffness calibration methods, which equate the measured thermal vibration spectrum near a resonance to that of a single eigenmode. Moreover, the principal axes may be arbitrarily rotated with respect to the measurement direction. In this work, the authors propose a method for calibrating the bending stiffness and mass of such nanowires' eigenmodes using a single measurement taken at an arbitrary orientation with respect to the principal axes.
悬臂或悬挂的纳米线由于其质量小、力灵敏度高和频率带宽高,在力或质量传感应用中具有广阔的应用前景。为了将这些纳米线用作定量传感器,必须通过实验校准其弯曲刚度或质量,通常使用热驱动振动来实现。然而,这可能很困难,因为纳米线略微不对称,这导致两个空间正交的弯曲本征模具有非常接近的频率。这种不对称性给传统的刚度校准方法带来了问题,因为这些方法将测量到的共振附近的热振动谱与单个本征模的振动谱等同起来。此外,主轴线可以相对于测量方向任意旋转。在这项工作中,作者提出了一种方法,该方法可以使用相对于主轴线任意取向的单个测量值来校准此类纳米线本征模的弯曲刚度和质量。