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通过原子力显微镜和接触角分析 PVP 在硅表面的接枝过程。

Analysis of the grafting process of PVP on a silicon surface by AFM and contact angle.

机构信息

Dpto de Química, Universidad Nacional del Comahue, Buenos Aires 1400, 8300 Neuquén, Argentina.

出版信息

Langmuir. 2011 Sep 20;27(18):11636-49. doi: 10.1021/la201683p. Epub 2011 Aug 24.

Abstract

Silicon wafers have been silylated with VTMS (vinyltrimethoxysilane) and hydrolyzed. Subsequently, PVP (polyvinyl pyrrolidone) was grafted onto the silylated surface by two different techniques: the grafting-through (GT) and the grafting-onto techniques (GO). The measurement of contact angles along with the topography analysis by atomic force microscopy (AFM) has allowed monitoring the different stages of the process and the temporal evolution of polymer grafting. The results have demonstrated the feasibility of both methods of grafting but have shown that the GT method gives a higher density of polymer-grafted chains. The AFM technique in adequate liquid environments has been proven to permit the surface density of chains to be distinguished by both methods and to estimate the length of the resulting PVP chains.

摘要

硅片经过 VTMS(乙烯基三甲氧基硅烷)硅烷化和水解。随后,通过两种不同的技术将 PVP(聚乙烯吡咯烷酮)接枝到硅烷化表面上:接枝贯穿(GT)和接枝到技术(GO)。通过测量接触角以及原子力显微镜(AFM)的形貌分析,监测了聚合物接枝过程的不同阶段和时间演变。结果表明,两种接枝方法都是可行的,但 GT 方法可以得到更高密度的聚合物接枝链。证明在适当的液体环境中,AFM 技术可以通过两种方法区分链的表面密度,并估计得到的 PVP 链的长度。

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