Department of Chemistry, Portland State University, PO Box 751, Portland, OR 97207-0751, USA.
J Colloid Interface Sci. 2012 Jan 1;365(1):178-83. doi: 10.1016/j.jcis.2011.08.081. Epub 2011 Sep 3.
A general method has been developed to determine the ionization constants of polymer thin films based on the stimuli-responsiveness of the polymer. Robust polymer films were fabricated on silicon wafers and gold slides using perfluorophenyl azide (PFPA) as the coupling agent. The ionization constants were measured by a number of techniques including ellipsometry, dynamic contact angle goniometry, and surface plasmon resonance imaging (SPRi). Using poly(4-vinylpyridine) (P4VP) as the model system, P4VP thin films were fabricated and the ionization constants of the films were measured taking advantage of the pH responsive property of the polymer. The pK(a) determined by ellipsometry, ~4.0, reflects the swelling of the polymer film in response to pH. The pK(a) value calculated from the dynamic contact angle measurements, ~5.0, relies on the change in hydrophilicity/hydrophobicity of the films as the polymer undergoes protonation/deprotonation. The pK(a) value measured by SPRi, ~4.9, monitors in situ the change of refractive index of the polymer thin film as it swells upon protonation. This was the first example where SPRi was used to measure the ionization constants of polymers.
已经开发出一种基于聚合物的刺激响应性来确定聚合物薄膜的离解常数的通用方法。使用全氟苯基叠氮化物 (PFPA) 作为偶联剂,在硅晶片和金载玻片上制造了坚固的聚合物膜。通过多种技术测量离解常数,包括椭圆光度法、动态接触角测角法和表面等离子体共振成像 (SPRi)。使用聚 (4-乙烯基吡啶) (P4VP) 作为模型系统,制造了 P4VP 薄膜,并利用聚合物的 pH 响应特性测量了薄膜的离解常数。椭圆光度法确定的 pK(a),约为 4.0,反映了聚合物薄膜在 pH 响应下的溶胀。从动态接触角测量计算出的 pK(a)值,约为 5.0,依赖于薄膜的亲水性/疏水性的变化,因为聚合物经历质子化/去质子化。通过 SPRi 测量的 pK(a)值,约为 4.9,原位监测聚合物薄膜在质子化时折射率的变化。这是首次使用 SPRi 测量聚合物的离解常数的例子。