Süssmann F, Zherebtsov S, Plenge J, Johnson Nora G, Kübel M, Sayler A M, Mondes V, Graf C, Rühl E, Paulus G G, Schmischke D, Swrschek P, Kling M F
Max-Planck-Institut für Quantenoptik, Hans-Kopfermann-Strasse 1, D-85748 Garching, Germany.
Rev Sci Instrum. 2011 Sep;82(9):093109. doi: 10.1063/1.3639333.
High-speed, single-shot velocity-map imaging (VMI) is combined with carrier-envelope phase (CEP) tagging by a single-shot stereographic above-threshold ionization (ATI) phase-meter. The experimental setup provides a versatile tool for angle-resolved studies of the attosecond control of electrons in atoms, molecules, and nanostructures. Single-shot VMI at kHz repetition rate is realized with a highly sensitive megapixel complementary metal-oxide semiconductor camera omitting the need for additional image intensifiers. The developed camera software allows for efficient background suppression and the storage of up to 1024 events for each image in real time. The approach is demonstrated by measuring the CEP-dependence of the electron emission from ATI of Xe in strong (≈10(13) W/cm(2)) near single-cycle (4 fs) laser fields. Efficient background signal suppression with the system is illustrated for the electron emission from SiO(2) nanospheres.
高速单次速度映射成像（VMI）与通过单次立体阈上电离（ATI）相位计进行的载波包络相位（CEP）标记相结合。该实验装置为角度分辨研究原子、分子和纳米结构中电子的阿秒控制提供了一种通用工具。利用高灵敏度百万像素互补金属氧化物半导体相机实现了kHz重复率的单次VMI，无需额外的图像增强器。开发的相机软件允许进行有效的背景抑制，并实时存储每个图像多达1024个事件。通过测量强（≈10(13) W/cm(2)）近单周期（4 fs）激光场中氙的ATI电子发射的CEP依赖性来证明该方法。展示了该系统对SiO(2)纳米球电子发射的有效背景信号抑制。
