Grote Richard R, Driscoll Jeffrey B, Biris Claudiu G, Panoiu Nicolae C, Osgood Richard M
Microelectronics Sciences Laboratories, Columbia University, New York, NY 10027, USA.
Opt Express. 2011 Dec 19;19(27):26406-15. doi: 10.1364/OE.19.026406.
We show by theory and experiment that silicon-dioxide-cladding gratings for Fabry-Pérot cavities on silicon-on-insulator channel ("wire") waveguides provide a low-refractive-index perturbation, which is required for several important integrated photonics components. The underlying refractive index perturbation of these gratings is significantly weaker than that of analogous silicon gratings, leading to finer control of the coupling coefficient κ. Our Fabry-Pérot cavities are designed using the transfer-matrix method (TMM) in conjunction with the finite element method (FEM) for calculating the effective index of each waveguide section. Device parameters such as coupling coefficient, κ, Bragg mirror stop band, Bragg mirror reflectivity, and quality factor Q are examined via TMM modeling. Devices are fabricated with representative values of distributed Bragg reflector lengths, cavity lengths, and propagation losses. The measured transmission spectra show excellent agreement with the FEM/TMM calculations.
我们通过理论和实验表明,绝缘体上硅通道(“线”)波导上用于法布里 - 珀罗腔的二氧化硅包层光栅提供了低折射率微扰,这是几种重要的集成光子学组件所必需的。这些光栅潜在的折射率微扰明显弱于类似的硅光栅,从而能够更精细地控制耦合系数κ。我们的法布里 - 珀罗腔是使用转移矩阵法(TMM)结合有限元法(FEM)设计的,用于计算每个波导段的有效折射率。通过TMM建模研究了诸如耦合系数κ、布拉格镜阻带、布拉格镜反射率和品质因数Q等器件参数。制造的器件具有分布式布拉格反射器长度、腔长度和传播损耗的代表性值。测量的透射光谱与FEM/TMM计算结果显示出极好的一致性。