Agile linear interferometric method for carrier-envelope phase drift measurement.

A bandwidth-independent and linear interferometric method for the measurement of the carrier-envelope phase drift of ultrashort pulse trains is demonstrated. The pulses are temporally overlapped in a resonant multiple-beam interferometer. From the position of the spectral interference pattern, the relative carrier-envelope phase between two subsequent oscillator pulses is obtained at data acquisition rates up to 200 Hz. Cross calibration has been performed by f-to-2f interferometry in two independent experiments. The optical length of the interferometer has been actively stabilized, leading to a phase jitter of 117 mrad (rms). These results indicate a reduced noise and quicker data acquisition in comparison with previous linear methods for measuring the carrier-envelope phase drift.