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优化计算机断层扫描中的细节可探测性。

Optimised detail detectability in computerised tomography.

机构信息

Department of Mechanical Engineering, Division of Engineering Materials, Linköpings Universitet, Sweden.

出版信息

J Xray Sci Technol. 1998 Jan 1;8(1):51-73.

Abstract

It is of interest to know the minimum discernible detail size when performing non-destructive testing with high-resolution computerised tomography. But it is difficult to empirically find optimal parameter settings that maximise detectability for each individual imaging task. In this work a method to determine the optimal performance for a high-resolution computerised tomography system has been developed. It reveals the detectability limit for specific contrasting details in terms of imaged object diameter when the signal-to-noise ratio, SNRΔS,CT, between the contrasting detail and its surroundings has been maximised using optimal data collection parameter settings.This work includes modelling and verification of the total unsharpness of the CT-system in terms of modulation transfer-function, MTF. Together with the limiting perception factor and maximised SNRΔproj in the CT projection data, the detectability limits for any specific contrasting detail are determined as a function of imaged object material and geometry. Maximised SNRΔproj was obtained by optimising the parameters: X-ray source tube potential, X-ray filter, exposure time and optical aperture. The importance of using optimal settings when performing CT-investigations, especially when investigating objects with large diameters, is demonstrated.It was found that it is possible to predict the detectability for any specific contrasting detail. It was also discovered that the optimal settings for a given object diameter and material are dependent on the detail material. In some cases an improvement of the detail signal-to-noise-ratio was obtained by using a combination of X-ray filter materials. It was also found that SNRΔproj is very sensitive to the thickness of denser X-ray filter materials (higher atomic number and density).

摘要

在使用高分辨率计算机断层扫描进行无损检测时,了解最小可分辨细节尺寸是很有意义的。但是,很难通过经验找到针对每个特定成像任务最大化可检测性的最佳参数设置。在这项工作中,开发了一种确定高分辨率计算机断层扫描系统最佳性能的方法。它揭示了在使用最佳数据采集参数设置最大化对比细节与其周围环境之间的信噪比 SNRΔS,CT 的情况下,特定对比细节的可检测极限,以成像对象直径表示。

这项工作包括根据调制传递函数(MTF)对 CT 系统的总不清晰度进行建模和验证。与限制感知因子和 CT 投影数据中的最大 SNRΔproj 一起,任何特定对比细节的检测极限都作为成像对象材料和几何形状的函数来确定。通过优化参数:X 射线源管电压、X 射线滤波器、曝光时间和光学孔径,获得了最大 SNRΔproj。演示了当进行 CT 研究时,特别是当研究直径较大的物体时,使用最佳设置的重要性。

结果表明,可以预测任何特定对比细节的可检测性。还发现,对于给定的物体直径和材料,最佳设置取决于细节材料。在某些情况下,通过使用 X 射线滤光材料的组合,可以提高细节的信噪比。还发现 SNRΔproj 对密度较高的 X 射线滤光材料(较高的原子数和密度)的厚度非常敏感。

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