Instituto de Ciencia de Materiales de Sevilla (CSIC-Univ. Sevilla), Avda. Américo Vespucio 49, 41092 Sevilla, Spain.
J Colloid Interface Sci. 2012 Jun 15;376(1):274-82. doi: 10.1016/j.jcis.2012.03.010. Epub 2012 Mar 22.
The wetting behavior of fluorocarbon materials has been studied with the aim of assessing the influence of the surface chemical composition and surface roughness on the water advancing and receding contact angles. Diamond like carbon and two fluorocarbon materials with different fluorine content have been prepared by plasma enhanced chemical vapor deposition and characterized by X-ray photoemission, Raman and FT-IR spectroscopies. Very rough surfaces have been obtained by deposition of thin films of these materials on polymer substrates previously subjected to plasma etching to increase their roughness. A direct correlation has been found between roughness and water contact angles while a superhydrophobic behavior (i.e., water contact angles higher than 150° and relatively low adhesion energy) was found for the films with the highest fluorine content deposited on very rough substrates. A critical evaluation of the methods currently used to assess the roughness of these surfaces by atomic force microscopy (AFM) has evidenced that calculated RMS roughness values and actual surface areas are quite dependent on both the scale of observation and image resolution. A critical discussion is carried out about the application of the Wenzel model to account for the wetting behavior of this type of surfaces.
氟碳材料的润湿行为已经过研究,旨在评估表面化学成分和表面粗糙度对水前进和后退接触角的影响。通过等离子体增强化学气相沉积制备了类金刚石和两种氟含量不同的氟碳材料,并通过 X 射线光电子能谱、拉曼和傅里叶变换红外光谱进行了表征。通过将这些材料的薄膜沉积在先前经过等离子体蚀刻以增加其粗糙度的聚合物衬底上,获得了非常粗糙的表面。发现粗糙度与水接触角之间存在直接相关性,而在非常粗糙的衬底上沉积氟含量最高的薄膜表现出超疏水性(即水接触角高于 150°,且相对低的粘附能)。通过原子力显微镜(AFM)评估这些表面粗糙度的现有方法进行了严格评估,结果表明,计算得到的 RMS 粗糙度值和实际表面积非常依赖于观察范围和图像分辨率。对 Wenzel 模型在解释此类表面润湿行为中的应用进行了严格的讨论。