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宫内节育器(IUDs)的俄歇电子能谱和质子激发X射线发射微分析

Auger and pixe microanalysis of intrauterine devices (IUDs).

作者信息

Foti A, Foti A M, Torrisi L

机构信息

Divisione di Ginecologia, Stabilimento Ospedaliero di Monselice, Padova, Italy.

出版信息

Clin Exp Obstet Gynecol. 1990;17(3-4):185-94.

PMID:2292147
Abstract

Auger Emission Spectroscopy (AES) and Particle Induced X-ray Emission (PIXE) analysis were employed in a study on the calcification and oxidation processes of the copper wires used in Intra-Uterine Device (IUDs) contraceptives. A strong copper release (approximately 50 micrograms/day) has been observed in the first year of IUDS application during the high device antifertility effect. The copper release is reduced with the IUD-use time, because of the calcification process on the surface by organic liquids. This effect produces a drastic reduction in the contraceptive efficiency, and a new IUDs replacement is needed after about 2 years of use. Auger, X-ray spectrometry and scanning electron microscopy (SEM) have been used to investigate the lifetime and efficiency of IUDS in order to understand the surface modification of copper wire during its permanence in the intrauterine environment.

摘要

俄歇电子能谱(AES)和粒子诱导X射线发射(PIXE)分析被用于一项关于宫内节育器(IUD)避孕药中使用的铜线钙化和氧化过程的研究。在宫内节育器应用的第一年,在其高效抗生育作用期间,观察到大量的铜释放(约50微克/天)。由于有机液体在表面的钙化过程,铜释放量随着宫内节育器使用时间的增加而减少。这种效应导致避孕效率急剧下降,使用约2年后需要更换新的宫内节育器。已使用俄歇电子能谱、X射线光谱和扫描电子显微镜(SEM)来研究宫内节育器的使用寿命和效率,以便了解铜线在子宫内环境中留存期间的表面改性情况。

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