Optical model for multilayer structures with coherent, partly coherent and incoherent layers.

We present a novel approach for modeling the reflectance, transmittance and absorption depth profile of thin-film multilayer structures such as solar cells. Our model is based on the net-radiation method adapted for coherent calculations and is highly flexible while using a simple algorithm. We demonstrate that as a result arbitrary multilayer structures with coherent, partly coherent and incoherent layers can be simulated more accurately at much lower computational cost.