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ZnS 薄膜在 ZnO/CdTe 纳米电缆阵列光阳极中显著增强光电流的双重作用。

Dual roles of ZnS thin layers in significant photocurrent enhancement of ZnO/CdTe nanocable arrays photoanode.

机构信息

Hubei Collaborative Innovation Center for Advanced Organic Chemical Materials, Faculty of Physics and Electronic Technology, Hubei University, Wuhan 430062, PR China.

出版信息

ACS Appl Mater Interfaces. 2013 Apr 24;5(8):3312-6. doi: 10.1021/am4003793. Epub 2013 Apr 4.

Abstract

The effect of a ZnS thin layer on the photoelectrochemical property of ZnO/CdTe nanocable arrays-on-indium tin oxide was systematically studied by the successive ion layer absorption and reaction (SILAR) of ZnS. The thickness of CdTe on bare ZnO/CdTe nanocable arrays was optimized to approximately 10 nm to achieve a saturated photocurrent density of 6.5 mA/cm(2). Significant photocurrent enhancement was achieved by gradually increasing the ZnS SILAR cycle number from 0 to 10. A "type I" band alignment with conduction and valence band offsets of 0.58 and 1.52 eV, respectively, was deduced for the CdTe/ZnS interface. The detailed microstructure of the CdTe/ZnS interface and the relationship between the photocurrent and the ZnS thickness indicated that ZnS not only serves as a barrier layer that prevents electron injection from CdTe to the electrolyte but also provides an effective tunneling channel for hole transfers to the electrolyte. A ZnO/CdTe/ZnS nanocable photoanode yielded a saturated photocurrent density of 13.8 mA/cm(2) when the thickness of ZnS was controlled to approximately 2 nm.

摘要

采用连续离子层吸附反应(SILAR)法在 ZnO/CdTe 纳米电缆阵列-氧化铟锡上沉积 ZnS 薄层,系统研究了其对 ZnO/CdTe 纳米电缆阵列光电化学性能的影响。将裸 ZnO/CdTe 纳米电缆阵列上的 CdTe 厚度优化至约 10nm,以获得饱和光电流密度为 6.5mA/cm(2)。通过逐渐增加 ZnS SILAR 循环次数从 0 增加到 10,实现了显著的光电流增强。CdTe/ZnS 界面的能带排列为“Ⅰ型”,导带和价带偏移分别为 0.58 和 1.52eV。CdTe/ZnS 界面的详细微观结构以及光电流与 ZnS 厚度之间的关系表明,ZnS 不仅作为阻挡层防止电子从 CdTe 注入到电解质中,而且还为空穴向电解质的有效隧穿提供了通道。当 ZnS 厚度控制在约 2nm 时,ZnO/CdTe/ZnS 纳米电缆光阳极的饱和光电流密度为 13.8mA/cm(2)。

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