Physical Chemistry of Biosystems, Physical Chemistry Institute, University of Heidelberg, 69120 Heidelberg, Germany.
J Phys Chem B. 2013 May 2;117(17):5002-8. doi: 10.1021/jp401869t. Epub 2013 Apr 23.
We have demonstrated that the complementary combination of grazing incidence X-ray fluorescence (GIXF) with specular X-ray reflectivity (XRR) can be used to quantitatively determine the density profiles of Ni(2)(+) ions complexed with chelator headgroups as well as S atoms in recombinant proteins anchored to lipid monolayers at the air/water interface. First, we prepared phospholipid monolayers incorporating chelator lipid anchors at different molar fractions at the air/water interface. The fine-structures perpendicular to the global plane of monolayers were characterized by XRR in the presence of Ni(2)(+) ions, yielding the thickness, roughness, and electron density of the stratified lipid monolayers. X-ray fluorescence intensities from Ni Kα core levels recorded at the incidence angles below and above the critical angle of total reflection allow for the determination of the position and lateral density of Ni(2)(+) ions associated with chelator headgroups with a high spatial accuracy (±5 Å). The coupling of histidine-tagged Xenopus cadherin 11 (Xcad-11) can also be identified by changes in the fines-structures using XRR. Although fluorescence intensities from S Kα level were much weaker than Ni Kα signals, we could detect the location of S atoms in recombinant Xcad-11 proteins.
我们已经证明,掠入射 X 射线荧光(GIXF)与镜面 X 射线反射率(XRR)的互补组合可用于定量确定与螯合剂头基配位的 Ni(2)(+)离子以及重组蛋白中 S 原子的密度分布,这些蛋白通过脂质单层锚定在气/水界面上。首先,我们在气/水界面上制备了含有不同摩尔分数螯合脂质锚的磷脂单层。在存在 Ni(2)(+)离子的情况下,通过 XRR 对垂直于单层全局平面的精细结构进行了表征,得出了分层脂质单层的厚度、粗糙度和电子密度。在低于和高于全反射临界角的入射角下记录的 Ni Kα 芯级的 X 射线荧光强度允许以高空间精度(±5 Å)确定与螯合剂头基结合的 Ni(2)(+)离子的位置和横向密度。使用 XRR 还可以通过精细结构的变化来识别组氨酸标记的非洲爪蟾钙粘蛋白 11(Xcad-11)的耦合。尽管 S Kα 级的荧光强度比 Ni Kα 信号弱得多,但我们可以检测到重组 Xcad-11 蛋白中 S 原子的位置。