Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA.
ACS Comb Sci. 2013 Jun 10;15(6):273-7. doi: 10.1021/co4000375. Epub 2013 May 21.
This paper demonstrates the feasibility of high-throughput investigation of ionic conductivity in oxygen-ion conductors. Yttria stabilized zirconia (YSZ) composition-spread thin films with nanometer-size grains were prepared by 90° off-axis reactive RF cosputtering. We compare results for two electrode configurations, namely, out-of-plane (parallel plate) and in-plane (planar interdigitated electrode) and find that the contribution from the intragrain conductivity in YSZ thin films (150 nm) is more explicit in the latter configuration because it greatly diminishes electrode effects. The intragrain oxygen ion conductivity of thin film YSZ was systematically measured as a function of yttria concentration over the range 2 mol % to 12 mol %. The results show that the measured conductivity of the YSZ thin films is close to that of corresponding bulk materials with a peak value around 3 × 10⁻⁴ S cm⁻¹ at 440 °C at the optimum Y₂O₃ concentration of 8 mol %. Validation of this technique means that it can be applied to novel chemical systems for which systematic bulk measurements have not been attempted.
本文证明了在氧离子导体中进行高通量离子电导率研究的可行性。采用 90°离轴反应射频共溅射法制备了具有纳米晶粒尺寸的 YSZ 组成扩展薄膜。我们比较了两种电极配置(即平面外(平行板)和平面内(平面叉指电极))的结果,发现由于电极效应大大减小,YSZ 薄膜(150nm)中的晶内电导率在后者的配置中更为明显。我们系统地测量了 YSZ 薄膜的晶内氧离子电导率作为氧化钇浓度的函数,范围为 2mol%至 12mol%。结果表明,YSZ 薄膜的测量电导率与相应的体材料接近,在最佳 Y₂O₃浓度为 8mol%时,在 440°C 下约为 3×10⁻⁴S cm⁻¹,峰值接近 3×10⁻⁴S cm⁻¹。该技术的验证意味着它可以应用于尚未进行系统体测量的新型化学体系。