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银纳米线中变形机制从位错介导滑移向均匀滑移的转变。

Transformation of the deformation mechanism from dislocation-mediated slip to homogeneous slip in silver nanowires.

作者信息

Feng Jianbo, Kizuka Tokushi

机构信息

Division of Materials Science, Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan.

出版信息

J Nanosci Nanotechnol. 2013 Jan;13(1):394-400. doi: 10.1166/jnn.2013.6899.

Abstract

The tensile deformation behavior of silver (Ag) wires with nanometer widths (nanowires (NWs)) was observed by in situ high-resolution transmission electron microscopy combined with subnanonewton force measurements. The Young's modulus, strength, and critical shear stress of the Ag NWs were investigated based on the mechanics of materials at the atomic scale. It was found that when the minimum cross-sectional area of the NWs decreased to less than approximately 3.2 nm2, the critical shear stress increased with a decrease in the area. In addition, when the minimum cross-sectional area decreased to less than approximately 0.5 nm2 before fracture, the critical shear stress reached 0.96 GPa, which exceeded the theoretical shear stress of bulk Ag crystals on {1111} along (110). The present results indicate that the deformation mechanism of Ag NWs transformed from dislocation-mediated slip to homogeneous slip. Therefore, it can be concluded that size reduction to nanometer scale leads to a considerable increase in strength.

摘要

通过原位高分辨率透射电子显微镜结合亚纳牛顿力测量,观察了具有纳米宽度的银(Ag)线(纳米线(NWs))的拉伸变形行为。基于原子尺度的材料力学,研究了Ag纳米线的杨氏模量、强度和临界剪切应力。研究发现,当纳米线的最小横截面积减小到小于约3.2nm²时,临界剪切应力随面积减小而增加。此外,当断裂前最小横截面积减小到小于约0.5nm²时,临界剪切应力达到0.96GPa,超过了体相Ag晶体沿{1111}方向(110)的理论剪切应力。目前的结果表明,Ag纳米线的变形机制从位错介导的滑移转变为均匀滑移。因此,可以得出结论,尺寸减小到纳米尺度会导致强度显著增加。

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