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通过掺铟氧化锌纳米线表面层的量子干涉输运。

Quantum-interference transport through surface layers of indium-doped ZnO nanowires.

机构信息

NCTU-RIKEN Joint Research Laboratory and Institute of Physics, National Chiao Tung University, Hsinchu 30010, Taiwan.

出版信息

Nanotechnology. 2013 Jun 21;24(24):245203. doi: 10.1088/0957-4484/24/24/245203. Epub 2013 May 20.

Abstract

We have fabricated indium-doped ZnO (IZO) nanowires (NWs) and carried out four-probe electrical-transport measurements on two individual NWs with geometric diameters of ≈70 and ≈90 nm in a wide temperature T interval of 1-70 K. The NWs reveal overall charge conduction behavior characteristic of disordered metals. In addition to the T dependence of resistance R, we have measured the magnetoresistance (MR) in magnetic fields applied either perpendicular or parallel to the NW axis. Our R(T) and MR data in different T intervals are consistent with the theoretical predictions of the one- (1D), two- (2D) or three-dimensional (3D) weak-localization (WL) and the electron-electron interaction (EEI) effects. In particular, a few dimensionality crossovers in the two effects are observed. These crossover phenomena are consistent with the model of a 'core-shell-like structure' in individual IZO NWs, where an outer shell of thickness t (~15-17 nm) is responsible for the quantum-interference transport. In the WL effect, as the electron dephasing length Lφ gradually decreases with increasing T from the lowest measurement temperatures, a 1D-to-2D dimensionality crossover takes place around a characteristic temperature where Lφ approximately equals d, an effective NW diameter which is slightly smaller than the geometric diameter. As T further increases, a 2D-to-3D dimensionality crossover occurs around another characteristic temperature where Lφ approximately equals t (<d). In the EEI effect, a 2D-to-3D dimensionality crossover takes place when the thermal diffusion length LT progressively decreases with increasing T and approaches t. However, a crossover to the 1D EEI effect is not seen because LT < d even at T = 1 K in our IZO NWs. Furthermore, we explain the various inelastic electron scattering processes which govern Lφ. This work demonstrates the complex and rich nature of the charge conduction properties of group-III metal-doped ZnO NWs. This work also strongly indicates that the surface-related conduction processes are essential to doped semiconductor nanostructures.

摘要

我们制备了掺铟氧化锌(IZO)纳米线(NWs),并在 1-70 K 的宽温度 T 范围内对两条几何直径约为 70 和 90 nm 的单个 NW 进行了四点式电输运测量。这些 NW 表现出无序金属的整体电荷传导行为。除了电阻 R 随温度 T 的变化外,我们还在垂直或平行于 NW 轴的磁场中测量了磁电阻(MR)。我们在不同 T 区间的 R(T)和 MR 数据与一维(1D)、二维(2D)或三维(3D)弱局域化(WL)和电子-电子相互作用(EEI)效应的理论预测一致。特别是,在这两个效应中观察到了几个维度的交叉。这些交叉现象与单个 IZO NW 中“核壳结构”的模型一致,其中厚度约为 15-17nm 的外壳负责量子干涉输运。在 WL 效应中,随着电子退相长度 Lφ 随着温度 T 的升高从最低测量温度逐渐减小,在一个特征温度下发生了从一维到二维的维度交叉,这个特征温度大约等于 d,即有效 NW 直径略小于几何直径。随着 T 的进一步升高,在另一个特征温度下发生了从二维到三维的维度交叉,此时 Lφ 大约等于 t(<d)。在 EEI 效应中,当热扩散长度 LT 随着温度 T 的升高而逐渐减小并接近 t 时,发生了从二维到三维的维度交叉。然而,由于在我们的 IZO NW 中即使在 T = 1 K 时 LT < d,因此没有看到向一维 EEI 效应的交叉。此外,我们解释了控制 Lφ 的各种非弹性电子散射过程。这项工作展示了 III 族金属掺杂 ZnO NW 的电荷输运性质的复杂性和丰富性。这项工作还强烈表明,表面相关的传导过程对于掺杂半导体纳米结构至关重要。

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